• DocumentCode
    3113934
  • Title

    Hierarchical test generation for data path

  • Author

    Jay, C. ; De Paulet, M. Crastes ; Karam, M. ; Saucier, G.

  • Author_Institution
    VLSI Technol. Inc., Valbonne, France
  • fYear
    1990
  • fDate
    29 May-1 Jun 1990
  • Firstpage
    326
  • Lastpage
    331
  • Abstract
    A method of hierarchical test generation for data path is proposed. The test patterns are generated for the basic blocks of a classical data path library. These test patterns are propagated to the inputs and to the outputs of the data path by two methods. The first one, practically implemented, enumerates backpropagation paths based on structural considerations, selects one and then performs consistency for real local test patterns. The second one works directly on symbolic values and uses immediately the back and forward propagation paths. Both methods take advantage of the existence of transparent blocks
  • Keywords
    PROLOG; automatic testing; logic testing; software tools; backpropagation paths; data path; hierarchical test generation; real local test; symbolic values; test patterns; transparent blocks; Backpropagation; Libraries; Logic testing; Pain; Performance evaluation; Prototypes; Registers; Space exploration; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Euro ASIC '90
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-2066-8
  • Type

    conf

  • DOI
    10.1109/EASIC.1990.207963
  • Filename
    207963