DocumentCode
3113934
Title
Hierarchical test generation for data path
Author
Jay, C. ; De Paulet, M. Crastes ; Karam, M. ; Saucier, G.
Author_Institution
VLSI Technol. Inc., Valbonne, France
fYear
1990
fDate
29 May-1 Jun 1990
Firstpage
326
Lastpage
331
Abstract
A method of hierarchical test generation for data path is proposed. The test patterns are generated for the basic blocks of a classical data path library. These test patterns are propagated to the inputs and to the outputs of the data path by two methods. The first one, practically implemented, enumerates backpropagation paths based on structural considerations, selects one and then performs consistency for real local test patterns. The second one works directly on symbolic values and uses immediately the back and forward propagation paths. Both methods take advantage of the existence of transparent blocks
Keywords
PROLOG; automatic testing; logic testing; software tools; backpropagation paths; data path; hierarchical test generation; real local test; symbolic values; test patterns; transparent blocks; Backpropagation; Libraries; Logic testing; Pain; Performance evaluation; Prototypes; Registers; Space exploration; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Euro ASIC '90
Conference_Location
Paris
Print_ISBN
0-8186-2066-8
Type
conf
DOI
10.1109/EASIC.1990.207963
Filename
207963
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