DocumentCode
3114079
Title
A Test Process Improvement Model for Embedded Software Developments
Author
Jung, Eun
fYear
2009
fDate
24-25 Aug. 2009
Firstpage
432
Lastpage
437
Abstract
Embedded software requires high quality to meet customer requirements and to achieve product competitiveness. Testability maturity model (TMM)and test process improvement (TPI) are recommended to improve test activities, which are important for product quality. However, TMM and TPI in themselves are not appropriate for embedded software since they are lack of consideration on embedded software. This paper deals with the properties of embedded software and industrial challenges based on existing model and we suggest embedded test process improvement model (Emb-TPI). Emb-TPI considers practical improvement strategies for the quality of embedded software and focuses on evaluation procedures that achieve cost-effectiveness and valid evaluation results. We present the results of applying Emb-TPI to product development division (PDD) to prove that the model is valid. Emb-TPI provides methods to evaluate test activities in embedded software development and helps to reveal insufficient areas of test activities, which ultimately improves test capabilities.
Keywords
embedded systems; product development; program testing; software quality; embedded software developments; embedded test process improvement model; product competitiveness; product development division; product quality; Capability maturity model; Computer industry; Coordinate measuring machines; Costs; Electronic equipment testing; Embedded software; Hardware; Software quality; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Software, 2009. QSIC '09. 9th International Conference on
Conference_Location
Jeju
ISSN
1550-6002
Print_ISBN
978-1-4244-5912-4
Type
conf
DOI
10.1109/QSIC.2009.64
Filename
5381375
Link To Document