DocumentCode :
3114129
Title :
Growth defects in cultured quartz: a microscopic investigation
Author :
Cordier, P. ; Doukhan, J.C. ; Buisson, X. ; Bignon, O.
Author_Institution :
Lab. de Structure et Proprietes de l´´Etat Solide, Univ. de Lille-Flandres-Artois, Villeneuve d´´Ascq, France
fYear :
1989
fDate :
31 May-2 Jun 1989
Firstpage :
459
Lastpage :
469
Abstract :
In some crystals, various types of defects are observed which can limit the performances of piezoelectric devices. Two distinct modes of water incorporation have been recognized, namely molecular water (tiny fluid inclusions with diameters down to 30 Å) and isolated point defects like the so-called 4HSi defects. The equilibrium concentration of this latter type of defects is extremely low at the usual T and P conditions of growth, but a supersaturation can occur for relatively large growth rates. The equilibrium concentration was determined as a function of T and P, and the diffusivity coefficient of the corresponding water species as a function of temperature was tentatively estimated
Keywords :
crystal growth from solution; piezoelectric devices; quartz; cultured quartz; diffusivity coefficient; growth rates; isolated point defects; molecular water; piezoelectric devices; supersaturation; water incorporation; Crystallization; Crystals; Electromagnetic wave absorption; Impurities; Optical microscopy; Optical scattering; Solids; Surfaces; Temperature; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/FREQ.1989.68904
Filename :
68904
Link To Document :
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