Title :
Design of encoders and self-testing checkers for some systematic unidirectional error detecting codes
Author :
Piestrak, Stanislaw J.
Author_Institution :
Inst. of Eng. Cybern., Wroclaw Univ. of Technol., Poland
Abstract :
Several schemes for designing encoders and self-testing checkers (STCs) for systematic unidirectional error detecting (UED) codes are known. In this paper, we propose the new improved designs for encoders and STCs for some optimal systematic UED codes, which include the t-UED Bose-Lin codes, burst UED codes, and Berger codes. For I information bits, the new universal scheme employs a pair of multi-output threshold circuits with a total of I inputs. It is shown that for all codes considered the logic functions of an encoder (and hence an STC as well) can easily be derived. This new design approach reduces the hardware complexity for any systematic UED code with relatively small number of check bits
Keywords :
automatic testing; encoding; error detection codes; threshold logic; Berger code; burst UED code; encoder; hardware complexity; logic function; multi-output threshold circuit; self-testing checker; systematic unidirectional error detecting code; t-UED Bose-Lin code; Built-in self-test; Circuit testing; Computer errors; Cybernetics; Design engineering; Digital systems; Encoding; Hardware; Logic functions; Programmable logic arrays;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628317
