DocumentCode :
3114304
Title :
Improved reachability analysis on retiming of Dsp algorithms with an efficient cell enumeration method
Author :
Gu, Shenshen
Author_Institution :
Shanghai Key Lab. of Power Station Autom. Technol., Shanghai Univ., Shanghai, China
fYear :
2011
fDate :
26-28 March 2011
Firstpage :
572
Lastpage :
576
Abstract :
Retiming is a very important technology to DSP because it can optimize hardware circuits by reallocating registers without affecting the function. When applying the DSP technology, marked graph is used as a model of computation, and retiming indeed is a transformation that changes the distribution of tokens on arcs in marked graph. The theoretical base for the retiming transformation is finding the set of functionally equivalent initial markings. This process is called reachability analysis. For this reason, reachability analysis is one of the most important problem on retiming of DSP. The reachability analysis in marked graph can be performed by finding a integer solution to a set of linear equation, which is known to be NP-complete. In this paper, a novel approach for finding the integer solution is introduced with a complexity bound of O((nu)n-m), where n is the number of nodes, m is the number of arcs and u is the upper bound of the number of firings for all individual arcs. By reconstructing the marked graph that makes n - m equals to one, this algorithm can provide a very efficient approach to retiming of DSP.
Keywords :
circuit optimisation; computational complexity; digital signal processing chips; optimising compilers; reachability analysis; DSP algorithm; NP-complete problem; cell enumeration method; computational complexity; hardware circuit optimization; linear equation; marked graph; reachability analysis; register reallocation; retiming transformation; Algorithm design and analysis; Complexity theory; Digital signal processing; Equations; Linear programming; Petri nets; Reachability analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Science and Technology (ICIST), 2011 International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-9440-8
Type :
conf
DOI :
10.1109/ICIST.2011.5765315
Filename :
5765315
Link To Document :
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