Title :
Non-contacting near-field mapping of planar circuits in microwave frequency band
Author :
Chen, Chun-Ping ; Sugawara, Kohei ; Li, Keren ; Nihei, Hiroshige ; Anada, Tetsuo ; Christopoulos, C.
Author_Institution :
Dept. of Electron.&Inf., Kanagawa Univ., Yokohama
Abstract :
An ultra-wideband near-field mapping system has been setup to scan the electromagnetic (EM) surface field above planar/PCB circuits. A semi-rigid coaxial electric probe is employed to measure the electric field up to 18 GHz and an improved CPW loop-type magnetic probe with self-resonance-suppression characteristics is used to measure the magnetic field up to more than 10 GHz. In order to verify the performance of our new system, EM surface field measurement were conducted for a short-circuited microstrip line, and a UWB (3.1 GHz - 10.6 GHz) filter using broadside-coupled structure, etc. The results demonstrate that the presented new measurement system is a powerful tool to accurately characterize the behavior of planar circuits in very wide frequency bands. The comparison between the measured results and the reference data validate the good performance of our system. In addition, a further study on extracting the effective dielectric constant of the PCB substrate is also demonstrated with the experimental validation by our system.
Keywords :
coplanar waveguide components; electric field measurement; microstrip lines; microwave circuits; printed circuits; surface electromagnetic waves; ultra wideband technology; CPW loop-type magnetic probe; PCB circuits; dielectric constant; electric field measurement; electromagnetic surface field; microwave frequency band; noncontacting near-field mapping; planar circuits; self-resonance-suppression characteristics; semirigid coaxial electric probe; short-circuited microstrip line; ultra-wideband near-field mapping system; Dielectric measurements; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Magnetic field measurement; Magnetic separation; Microwave circuits; Microwave frequencies; Probes; Ultra wideband technology; Field mapping; UWB; coaxial-type electric probe; loop-type magnetic probe;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652073