DocumentCode :
3114493
Title :
Characterizing the thermal performance of a flow through electronics module (SEM-E format) using a porous media model
Author :
Tang, L. ; Moores, K.A. ; Ramaswamy, C. ; Joshi, Y.
Author_Institution :
CALCE Center for Electron. Packaging, Maryland Univ., College Park, MD, USA
fYear :
1998
fDate :
10-12 Mar 1998
Firstpage :
68
Lastpage :
77
Abstract :
The fluid flow and heat transfer characteristics of a SEM-E electronics cooling module were simulated numerically by representing the internal offset fin structure with a Brinkman-Forchheimer-extended Darcy porous media model. A simplified mock-up of the module was constructed and operated through a range of flow rates (0.003-0.013 kg/s) and heat loads (100-200 W). The experimental set-up provided internal pressure drop data for use in the numerical model as well as discrete temperature measurements for validation of the computational results. The model closely captured the qualitative nature of the flow field and generally displayed good quantitative agreement with the measured temperature profile
Keywords :
cooling; electronic equipment testing; flow simulation; flow through porous media; modules; numerical analysis; packaging; temperature distribution; thermal analysis; 100 to 200 W; Brinkman-Forchheimer-extended Darcy porous media model; SEM-E electronics cooling module; SEM-E flow through electronics module; discrete temperature measurements; flow field; flow rate; fluid flow; heat load; heat transfer; internal offset fin structure; internal pressure drop data; model validation; module mock-up; numerical model; numerical simulation; porous media model; temperature profile; thermal performance; Aluminum; Electronic packaging thermal management; Electronics cooling; Electronics packaging; Friction; Heat transfer; Numerical models; Silicon carbide; Strips; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1998. SEMI-THERM Proceedings 1998., Fourteenth Annual IEEE
Conference_Location :
San Diego, CA
ISSN :
1065-2221
Print_ISBN :
0-7803-4486-3
Type :
conf
DOI :
10.1109/STHERM.1998.660390
Filename :
660390
Link To Document :
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