Title :
A mixed digital-analog simulation and test environment
Author_Institution :
Mietec Alcatel, Brussels, Belgium
fDate :
29 May-1 Jun 1990
Abstract :
A mixed digital-analog simulation and test environment, MIXTEST, has been developed, bridging the gap between a design and test department by automatic translation of the simulation results from the mixed digital-analog simulator, MIXSIM, into a mixed test program. This system truly allows design for testability on mixed digital-analog circuits, by using a test machine database containing all restrictions of the supported test equipment, during the design phase
Keywords :
application specific integrated circuits; circuit CAD; integrated circuit testing; MIXSIM; MIXTEST; all restrictions; design for testability; mixed digital-analog circuits; mixed digital-analog simulation; mixed test program; mixed-mode ASICs; supported test equipment; test environment; test machine database; Automatic testing; Circuit simulation; Circuit testing; Databases; Digital-analog conversion; Discrete event simulation; Test equipment; Timing; Voltage; Wheels;
Conference_Titel :
Euro ASIC '90
Conference_Location :
Paris
Print_ISBN :
0-8186-2066-8
DOI :
10.1109/EASIC.1990.208029
