• DocumentCode
    3114680
  • Title

    Localizing Software Faults Simultaneously

  • Author

    Abreu, Rui ; Zoeteweij, Peter ; Gemund, A.

  • Author_Institution
    Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2009
  • fDate
    24-25 Aug. 2009
  • Firstpage
    367
  • Lastpage
    376
  • Abstract
    Current automatic diagnosis techniques are predominantly of a statistical nature and, despite typical defect densities, do not explicitly consider multiple faults, as also demonstrated by the popularity of the single-fault Siemens set. We present a logic reasoning approach, called Zoltar-M(ultiple fault), that yields multiple-fault diagnoses, ranked in order of their probability. Although application of Zoltar-M to programs with many faults requires further research into heuristics to reduce computational complexity, theory as well as experiments on synthetic program models and two multiple-fault program versions from the Siemens set show that for multiple-fault programs this approach can outperform statistical techniques, notably spectrum-based fault localization (SFL). As a side-effect of this research, we present a new SFL variant, called Zoltar-S(ingle fault), that is provably optimal for single-fault programs, outperforming all other variants known to date.
  • Keywords
    computational complexity; probability; program diagnostics; software fault tolerance; Siemens; Zoltar-multiple fault; Zoltar-single fault; computational complexity; logic reasoning approach; multiple-fault program versions; probability; single-fault programs; software fault diagnosis; spectrum-based fault localization; synthetic program models; Computational complexity; Computer science; Embedded software; Fault diagnosis; Logic; Mathematics; Probability; Software debugging; Software quality; Testing; Software fault diagnosis; program spectra; statistical and reasoning approaches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Software, 2009. QSIC '09. 9th International Conference on
  • Conference_Location
    Jeju
  • ISSN
    1550-6002
  • Print_ISBN
    978-1-4244-5912-4
  • Type

    conf

  • DOI
    10.1109/QSIC.2009.55
  • Filename
    5381406