Title :
Localizing Software Faults Simultaneously
Author :
Abreu, Rui ; Zoeteweij, Peter ; Gemund, A.
Author_Institution :
Embedded Software Lab., Delft Univ. of Technol., Delft, Netherlands
Abstract :
Current automatic diagnosis techniques are predominantly of a statistical nature and, despite typical defect densities, do not explicitly consider multiple faults, as also demonstrated by the popularity of the single-fault Siemens set. We present a logic reasoning approach, called Zoltar-M(ultiple fault), that yields multiple-fault diagnoses, ranked in order of their probability. Although application of Zoltar-M to programs with many faults requires further research into heuristics to reduce computational complexity, theory as well as experiments on synthetic program models and two multiple-fault program versions from the Siemens set show that for multiple-fault programs this approach can outperform statistical techniques, notably spectrum-based fault localization (SFL). As a side-effect of this research, we present a new SFL variant, called Zoltar-S(ingle fault), that is provably optimal for single-fault programs, outperforming all other variants known to date.
Keywords :
computational complexity; probability; program diagnostics; software fault tolerance; Siemens; Zoltar-multiple fault; Zoltar-single fault; computational complexity; logic reasoning approach; multiple-fault program versions; probability; single-fault programs; software fault diagnosis; spectrum-based fault localization; synthetic program models; Computational complexity; Computer science; Embedded software; Fault diagnosis; Logic; Mathematics; Probability; Software debugging; Software quality; Testing; Software fault diagnosis; program spectra; statistical and reasoning approaches;
Conference_Titel :
Quality Software, 2009. QSIC '09. 9th International Conference on
Conference_Location :
Jeju
Print_ISBN :
978-1-4244-5912-4
DOI :
10.1109/QSIC.2009.55