Title :
Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters
Author :
Ker, Ming-Dou ; Liao, Chi-Sheng ; Yen, Cheng-Cheng
Author_Institution :
Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu
Abstract :
A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-mum CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.
Keywords :
CMOS integrated circuits; electromagnetic compatibility; electromagnetic interference; electrostatic discharge; filters; CMOS integrated circuit; board-level noise filtering networks; electrical transients; on-chip transient detection circuit; size 0.18 mum; system-level ESD protection; system-level electrostatic discharge protection; transient detection circuit; CMOS integrated circuits; Circuit optimization; Electromagnetic compatibility; Electromagnetic interference; Electrostatic discharge; Filtering; Filters; Integrated circuit noise; Protection; System-on-a-chip; ESD protection circuit; Electrostatic discharge (ESD); detection circuit; system-level ESD test;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652088
