Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

Author

Ker, Ming-Dou ; Liao, Chi-Sheng ; Yen, Cheng-Cheng

Author_Institution

Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu

fYear

2008

fDate

18-22 Aug. 2008

Firstpage

1

Lastpage

4

Abstract

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-mum CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

Keywords

CMOS integrated circuits; electromagnetic compatibility; electromagnetic interference; electrostatic discharge; filters; CMOS integrated circuit; board-level noise filtering networks; electrical transients; on-chip transient detection circuit; size 0.18 mum; system-level ESD protection; system-level electrostatic discharge protection; transient detection circuit; CMOS integrated circuits; Circuit optimization; Electromagnetic compatibility; Electromagnetic interference; Electrostatic discharge; Filtering; Filters; Integrated circuit noise; Protection; System-on-a-chip; ESD protection circuit; Electrostatic discharge (ESD); detection circuit; system-level ESD test;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on

Conference_Location

Detroit, MI

Print_ISBN

978-1-4244-1699-8

Electronic_ISBN

978-1-4244-1698-1

Type

conf

DOI

10.1109/ISEMC.2008.4652088

Filename

4652088