DocumentCode
311473
Title
High-speed InAIAs/InGaAs HBTs on 4-inch S.I. GaAs substrates
Author
Yakihara, T. ; Oka, S. ; Kobayashi, S. ; Fujita, T. ; Miura, A.
Author_Institution
Teratec Corp., Tokyo, Japan
fYear
1997
fDate
11-15 May 1997
Firstpage
217
Lastpage
219
Abstract
In this paper, we describe high-speed InAlAs/InGaAs HBTs on 4-inch S.I. GaAs substrates, which were made with constitutionally graded lattice-buffer layers and optimization of the epitaxial growth temperature. The use of these structures leads to excellent RF characteristics in spite of the thick base (200 nm) and collector (600 nm) of the HBTs. The maximum frequency (fmax) and the current gain cut-off frequency (ft) are 53 GHz and 37 GHz, respectively. We achieved a delay time of 26 ps for an ECL gate, which consists of 130 transistors, 150 resistors, and 10 capacitors on a 4-inch GaAs substrate
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; molecular beam epitaxial growth; 26 ps; 37 GHz; 4 inch; 53 GHz; ECL gate; GaAs; InAlAs-InGaAs; RF characteristics; constitutionally graded lattice-buffer layer; current gain cut-off frequency; delay time; epitaxial growth temperature optimization; high-speed InAIAs/InGaAs HBT; maximum frequency; semi-insulating GaAs substrate; Cutoff frequency; Delay effects; Epitaxial growth; Gallium arsenide; Indium compounds; Indium gallium arsenide; Radio frequency; Resistors; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1997., International Conference on
Conference_Location
Cape Cod, MA
ISSN
1092-8669
Print_ISBN
0-7803-3898-7
Type
conf
DOI
10.1109/ICIPRM.1997.600099
Filename
600099
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