• DocumentCode
    311473
  • Title

    High-speed InAIAs/InGaAs HBTs on 4-inch S.I. GaAs substrates

  • Author

    Yakihara, T. ; Oka, S. ; Kobayashi, S. ; Fujita, T. ; Miura, A.

  • Author_Institution
    Teratec Corp., Tokyo, Japan
  • fYear
    1997
  • fDate
    11-15 May 1997
  • Firstpage
    217
  • Lastpage
    219
  • Abstract
    In this paper, we describe high-speed InAlAs/InGaAs HBTs on 4-inch S.I. GaAs substrates, which were made with constitutionally graded lattice-buffer layers and optimization of the epitaxial growth temperature. The use of these structures leads to excellent RF characteristics in spite of the thick base (200 nm) and collector (600 nm) of the HBTs. The maximum frequency (fmax) and the current gain cut-off frequency (ft) are 53 GHz and 37 GHz, respectively. We achieved a delay time of 26 ps for an ECL gate, which consists of 130 transistors, 150 resistors, and 10 capacitors on a 4-inch GaAs substrate
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; molecular beam epitaxial growth; 26 ps; 37 GHz; 4 inch; 53 GHz; ECL gate; GaAs; InAlAs-InGaAs; RF characteristics; constitutionally graded lattice-buffer layer; current gain cut-off frequency; delay time; epitaxial growth temperature optimization; high-speed InAIAs/InGaAs HBT; maximum frequency; semi-insulating GaAs substrate; Cutoff frequency; Delay effects; Epitaxial growth; Gallium arsenide; Indium compounds; Indium gallium arsenide; Radio frequency; Resistors; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1997., International Conference on
  • Conference_Location
    Cape Cod, MA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-3898-7
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1997.600099
  • Filename
    600099