DocumentCode
3114890
Title
Experimental testing of thermal interface materials on non-planar surfaces
Author
Dean, Nancy F. ; Gettings, Amy L.
Author_Institution
Johnson Matthey Electron., Spokane, WA, USA
fYear
1998
fDate
10-12 Mar 1998
Firstpage
88
Lastpage
94
Abstract
As the power dissipated by electronic devices increases and package thermal performance improves, interfaces such as those between a package and heat sink become increasingly important components of the device thermal budget. As such, it is necessary to identify an interface material that will perform optimally under the conditions present in a given application. Unfortunately, standard test methods used to evaluate these materials usually idealize many of the test parameters, such as surface flatness, surface roughness, and test pressure, which characterize the application. Material performance can be significantly influenced by these parameters, necessitating testing in an application environment to identify an optimal interface. Since actual interfaces exhibit some distribution in flatness, roughness, etc., true application testing must involve a significant number of samples to capture expected results over the naturally occurring distributions. Enhancing standardized test methods to incorporate conditions which are reasonably expected to be found in most applications allows for a better comparison of materials. We propose additions to standardized test methods to capture deviations from idealized conditions and show experimental results which illustrate how relative material performance changes in response to surface flatness
Keywords
cooling; environmental testing; heat sinks; integrated circuit packaging; integrated circuit testing; interface structure; materials testing; plastic packaging; standards; surface topography; thermal analysis; application testing; ball grid array; device thermal budget; electronic devices; interface material; interface parameter distribution; material performance; nonplanar surfaces; optimal interface; package interfaces; package thermal performance; package-heat sink interface; plastic land grid array; power dissipation; relative material performance; standard test methods; standardized test methods; surface flatness; surface roughness; test parameters; test pressure; thermal interface materials testing; Assembly; Electronic packaging thermal management; Heat sinks; Materials testing; Rough surfaces; Surface resistance; Thermal conductivity; Thermal expansion; Thermal resistance; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1998. SEMI-THERM Proceedings 1998., Fourteenth Annual IEEE
Conference_Location
San Diego, CA
ISSN
1065-2221
Print_ISBN
0-7803-4486-3
Type
conf
DOI
10.1109/STHERM.1998.660392
Filename
660392
Link To Document