Power/ground noise immunity test in wireless and high-speed UWB communication system

Author

Yoon, Changwook ; Park, Hyunjeong ; Lee, Woojin ; Shin, Minchul ; So Pak, Jun ; Kim, Joungho

Author_Institution

Dept. of EECS, Korea Adv. Inst. of Sci. & Technol., Daejeon

fYear

2008

fDate

18-22 Aug. 2008

Firstpage

1

Lastpage

6

Abstract

This paper presents a wireless and high-speed transceiver system for Ultra-Wideband (UWB) communication with a high noise immunity. A proposed transceiver system has a high-speed data transmission up to 130 Mbps. Then, the measurement setup for the noise immunity test is introduced. Also, in order to demonstrate a noise immunity of the system, timing jitter, accumulated waveform, and bit error rate (BER) are measured in the presence of a power/ground noise with various frequencies or amplitudes. The numerous measurement results help to understand the relationship between the power/ground noise and the noise immunity of the proposed transceiver system.

Keywords

error statistics; immunity testing; noise; timing jitter; ultra wideband communication; accumulated waveform; bit error rate; high-speed UWB communication system; high-speed data transmission; power-ground noise immunity test; timing jitter; transceiver system; ultrawideband system; wireless UWB communication system; Bit error rate; Data communication; Noise level; Noise measurement; Power measurement; System testing; Timing jitter; Transceivers; Ultra wideband communication; Ultra wideband technology; Accumulated waveform; BER; Noise immunity; Power/ground noise; Timing jitter; UWB;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on

Conference_Location

Detroit, MI

Print_ISBN

978-1-4244-1699-8

Electronic_ISBN

978-1-4244-1698-1

Type

conf

DOI

10.1109/ISEMC.2008.4652098

Filename

4652098