Title :
Power/ground noise immunity test in wireless and high-speed UWB communication system
Author :
Yoon, Changwook ; Park, Hyunjeong ; Lee, Woojin ; Shin, Minchul ; So Pak, Jun ; Kim, Joungho
Author_Institution :
Dept. of EECS, Korea Adv. Inst. of Sci. & Technol., Daejeon
Abstract :
This paper presents a wireless and high-speed transceiver system for Ultra-Wideband (UWB) communication with a high noise immunity. A proposed transceiver system has a high-speed data transmission up to 130 Mbps. Then, the measurement setup for the noise immunity test is introduced. Also, in order to demonstrate a noise immunity of the system, timing jitter, accumulated waveform, and bit error rate (BER) are measured in the presence of a power/ground noise with various frequencies or amplitudes. The numerous measurement results help to understand the relationship between the power/ground noise and the noise immunity of the proposed transceiver system.
Keywords :
error statistics; immunity testing; noise; timing jitter; ultra wideband communication; accumulated waveform; bit error rate; high-speed UWB communication system; high-speed data transmission; power-ground noise immunity test; timing jitter; transceiver system; ultrawideband system; wireless UWB communication system; Bit error rate; Data communication; Noise level; Noise measurement; Power measurement; System testing; Timing jitter; Transceivers; Ultra wideband communication; Ultra wideband technology; Accumulated waveform; BER; Noise immunity; Power/ground noise; Timing jitter; UWB;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652098
