Defining a measure for the immunity of analogue to digital converters exposed to electric fields

Author

Aurand, Tobias ; Dawson, John F. ; Robinson, Martin P. ; Marvin, Andrew C.

Author_Institution

Dept. of Electron., Univ. of York, York

fYear

2008

fDate

18-22 Aug. 2008

Firstpage

1

Lastpage

4

Abstract

The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both psilaordinarypsila bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.

Keywords

analogue-digital conversion; digital integrated circuits; error statistics; integrated circuit measurement; radiofrequency interference; IC immunity measurement; RFI; analogue-to digital converters; bit errors; electric fields; histogram shape; radiofrequency interference; Analog-digital conversion; Current measurement; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Frequency; IEC standards; Integrated circuit testing; Interference; Signal analysis; ADC; IEC 62132; Immunity; Statistics; analogue to digital converter;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on

Conference_Location

Detroit, MI

Print_ISBN

978-1-4244-1699-8

Electronic_ISBN

978-1-4244-1698-1

Type

conf

DOI

10.1109/ISEMC.2008.4652111

Filename

4652111