Stress test of lithographic vertical-cavity surface-emitting lasers under extreme operating conditions

Reliability test data are presented, which show that non-oxide all-lithographic vertical-cavity surface-emitting lasers (VCSELs) are more reliable than oxide VCSELs under extreme operating conditions. The test data are compared for lithographic and oxide VCSELs of 3 μm size after operating at a stage temperature of 150°C and an injection current density of 140 kA/cm² for various times. The increased reliability under extreme operating conditions can be largely attributed to the lower junction temperature and the internal stress inside lithographic VCSELs.