• DocumentCode
    3115285
  • Title

    The repeatability of system level ESD test and relevant ESD generator parameters

  • Author

    Koo, Jayong ; Cai, Qing ; Pommerenke, David ; Wang, Kai ; Mass, John ; Hirata, Masayuki ; Martwick, Andy

  • Author_Institution
    Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Some system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.
  • Keywords
    electromagnetic compatibility; electrostatic discharge; EMC tests; discharge currents; relevant ESD generator parameters; semi-circular loop; system level ESD test; transient fields; world wide round robin test; Current measurement; Electronic equipment testing; Electrostatic discharge; IEC standards; Immunity testing; Performance evaluation; Reproducibility of results; Round robin; System testing; Voltage; ESD; ESD parameters; Electrostatic Discharge; Round Robin test; correlations; failure levels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652119
  • Filename
    4652119