DocumentCode :
3115336
Title :
A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes
Author :
Endo, Maki ; Tsuruta, Kosuke ; Kita, Soichiro ; Nakajima, Hiroshi
Author_Institution :
Sensing & Control Technol. Lab., Omron Corp., Kyoto
fYear :
2008
fDate :
12-15 Oct. 2008
Firstpage :
2099
Lastpage :
2104
Abstract :
In a factory setting, the zero-breakdown concept of manufacturing processes has been eagerly anticipated. In this article, the notion of machine health management technology is introduced in response to this requirement. The technology employs a cyclical and evolutional problem-solving approach using cause-effect structures. This paper will utilize an automatic acquisition method by using sensing data of machine behaviors. The problem to be solved here is to diagnose an anomaly using tact time delays of manufacturing lines. The cause-effect structure will illustrate the relationship between tact time delay anomalies and machine behaviors that lead to the anomalous conditions. The cause of the tact time delay can be identified by applying the cause-effect structure acquired through adopting a novel statistical processing approach using I/O signals of programmable logic controllers (PLCs). Experiments were conducted using an experimental manufacturing line to validate the effectiveness of the proposed method.
Keywords :
cause-effect analysis; data acquisition; delays; fault diagnosis; manufacturing processes; problem solving; programmable controllers; statistical analysis; I-O signals; PLC; anomaly diagnosis; automatic acquisition method; cause-effect structure acquisition; discrete manufacturing processes; evolutional problem-solving approach; machine behaviors; machine health management technology; programmable logic controllers; statistical processing approach; tact time delay anomalies; zero-breakdown concept; Data mining; Delay effects; Delay estimation; Electric breakdown; Feature extraction; Manufacturing processes; Productivity; Programmable control; Technology management; Visualization; anomaly diagnosis; cause-effect structure; manufacturing process; tact time delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man and Cybernetics, 2008. SMC 2008. IEEE International Conference on
Conference_Location :
Singapore
ISSN :
1062-922X
Print_ISBN :
978-1-4244-2383-5
Electronic_ISBN :
1062-922X
Type :
conf
DOI :
10.1109/ICSMC.2008.4811601
Filename :
4811601
Link To Document :
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