• DocumentCode
    3115393
  • Title

    Designing ad-hoc codes for the realization of fault tolerant CMOS networks

  • Author

    Bolchini, C. ; Buonanno, G. ; Cozzini, M. ; Sciuto, D. ; Stefanelli, R.

  • Author_Institution
    Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
  • fYear
    1997
  • fDate
    20-22 Oct 1997
  • Firstpage
    204
  • Lastpage
    211
  • Abstract
    An evolution of the already introduced technique for synthesis of CMOS gate structures tolerating all single transistor stuck-on faults and a large set of multiple faults is presented. Such technique is aimed at guaranteeing fault tolerance for a multiple output gate through the application of an AUED separated encoding of the output functions and the introduction of additional transistors, to avoid fault propagation. The improvement consists in the generation of an ad-hoc AUED code tailored on the circuit being designed, so that the number of additional transistors can be reduced
  • Keywords
    CMOS logic circuits; combinational circuits; error detection codes; integrated circuit reliability; logic design; AUED code generation; CMOS gate structures; ad-hoc codes; fault tolerant CMOS networks; multiple faults; multiple output gate; single transistor stuck-on faults; Circuit faults; Costs; Electrical fault detection; Encoding; Fault tolerance; Network synthesis; Semiconductor device modeling; Switches; Switching circuits; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
  • Conference_Location
    Paris
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-8168-3
  • Type

    conf

  • DOI
    10.1109/DFTVS.1997.628326
  • Filename
    628326