DocumentCode
3115393
Title
Designing ad-hoc codes for the realization of fault tolerant CMOS networks
Author
Bolchini, C. ; Buonanno, G. ; Cozzini, M. ; Sciuto, D. ; Stefanelli, R.
Author_Institution
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
fYear
1997
fDate
20-22 Oct 1997
Firstpage
204
Lastpage
211
Abstract
An evolution of the already introduced technique for synthesis of CMOS gate structures tolerating all single transistor stuck-on faults and a large set of multiple faults is presented. Such technique is aimed at guaranteeing fault tolerance for a multiple output gate through the application of an AUED separated encoding of the output functions and the introduction of additional transistors, to avoid fault propagation. The improvement consists in the generation of an ad-hoc AUED code tailored on the circuit being designed, so that the number of additional transistors can be reduced
Keywords
CMOS logic circuits; combinational circuits; error detection codes; integrated circuit reliability; logic design; AUED code generation; CMOS gate structures; ad-hoc codes; fault tolerant CMOS networks; multiple faults; multiple output gate; single transistor stuck-on faults; Circuit faults; Costs; Electrical fault detection; Encoding; Fault tolerance; Network synthesis; Semiconductor device modeling; Switches; Switching circuits; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location
Paris
ISSN
1550-5774
Print_ISBN
0-8186-8168-3
Type
conf
DOI
10.1109/DFTVS.1997.628326
Filename
628326
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