Title :
Estimation of Doppler spectrum from a vibrating metallic circular cylinder
Author :
Sarabandi, K. ; Lawrence, D.E.
Author_Institution :
Michigan Univ., USA
Abstract :
An analytical solution for the calculation of the bistatic scattered Doppler spectrum from a vibrating metallic circular cylinder is presented. First the scattering solution of a slightly deformed circular cylinder is obtained using a perturbation method. Then, assuming the vibration frequency is much smaller than the frequency of the incident electromagnetic plane wave, a closed form expression for the time-frequency response of the bistatic scattered field is obtained which can be used directly for estimating the Doppler spectrum. Results indicate that the scattered Doppler frequencies correspond to the mechanical vibration frequencies of the cylinder, and the sidelobe Doppler spectrum level is, to the first order, linearly proportional to the degree of deformation and is a function of bistatic angle. Utilizing the information in the scattered Doppler spectrum could provide an effective means of buried object identification, where acoustic waves are used to vibrate the buried object at resonance.
Keywords :
Doppler effect; buried object detection; conducting bodies; electromagnetic wave scattering; frequency estimation; perturbation techniques; radar applications; vibrations; Doppler frequencies; Doppler spectrum estimation; analytical solution; bistatic scattered Doppler spectrum; bistatic scattered field; buried object identification; closed form expression; incident electromagnetic plane wave; perturbation method; radar; scattering solution; sidelobe Doppler spectrum level; slightly deformed circular cylinder; time-frequency response; vibrating metallic circular cylinder; Acoustic scattering; Acoustic waves; Buried object detection; Electromagnetic fields; Electromagnetic scattering; Frequency estimation; Perturbation methods; Resonance; Time frequency analysis; Vibrations;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
DOI :
10.1109/APS.1999.789401