• DocumentCode
    3115543
  • Title

    Electromagnetic forces on point dipoles

  • Author

    Yaghjian, A.D.

  • Author_Institution
    AFRL/SNH, Hanscom AFB, MA, USA
  • Volume
    4
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    2868
  • Abstract
    The forces exerted on classical electric and magnetic dipoles by externally applied electromagnetic fields are derived from first principles. It is found, in accordance with Penfield and Haus (1967) and De Groot and Suttorp (1972), that the force on a magnetic dipole is the same for a perfectly conducting electric-current (Amperian) model and for a magnetic-charge model of the magnetic dipole, provided the sources of the externally applied field lie outside the dipole. However, if the dipoles lie within the polarization densities of the externally applied field, the force they experience depends on the model chosen for the dipoles (and for the polarization densities of the externally applied fields). The difference between the forces on point Amperian and magnetic-charge magnetic dipoles within the polarization densities of an external field has been used to demonstrate experimentally that neutrons scattered by the fields in ferromagnetic materials act like Amperian rather than magnetic-charge magnetic dipoles.
  • Keywords
    electromagnetic fields; electromagnetic forces; electromagnetic wave polarisation; ferromagnetic materials; magnetic moments; Amperian model; electric dipoles; electromagnetic forces; externally applied electromagnetic fields; ferromagnetic materials; magnetic-charge magnetic dipoles; magnetic-charge model; perfectly conducting electric-current model; point Amperian dipoles; polarization densities; scattered neutrons; Current distribution; Electromagnetic fields; Electromagnetic forces; Electromagnetic scattering; Lorentz covariance; Magnetic materials; Magnetic moments; Neutrons; Polarization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.789404
  • Filename
    789404