• DocumentCode
    3115604
  • Title

    The evolution of space-wave and surface-wave leaky modes on printed-circuit lines

  • Author

    Mesa, F. ; Jackson, D.R. ; Freire, M.J. ; Di Nallo, C.

  • Author_Institution
    Dept. of Electron. & Electromagn., Seville Univ., Spain
  • Volume
    4
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    2886
  • Abstract
    One of the goals of the present investigation is to determine the mathematical and physical relations between the bound mode and the two types of leaky modes that can exist on a printed-circuit structure. One of the important mathematical questions is when a particular type of modal solution can evolve into another type of modal solution. For example, under what conditions can a bound mode turn into a leaky mode as the frequency changes? Also, can one type of leaky mode turn into another type of leaky mode solution? Another important issue is the physical continuity between the modal solutions that exist. When a practical feed, such as a delta-gap source, is placed on a printed circuit line, the source will launch a bound mode current in addition to a continuous spectrum current on the line. By numerically studying the behavior of the continuous spectrum current on the line as frequency changes, the physical continuity in the continuous-spectrum current can be examined as one particular modal solution evolves into another type of solution, or as one particular leaky-mode solution loses or gains physical significance.
  • Keywords
    microstrip lines; printed circuits; waveguide theory; bound mode; continuous spectrum current; delta-gap source; evolution; frequency; modal solution; printed-circuit lines; space-wave leaky modes; surface-wave leaky modes; Coplanar waveguides; Current distribution; Dielectrics; Frequency; Integral equations; Microstrip; Power engineering and energy; Propagation constant; Strips; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.789410
  • Filename
    789410