Title :
Error identification and data recovery in MISR-based data compaction
Author :
Sun, Xiaoling ; Tutak, Wes
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
This paper introduces a novel data recovery scheme for multiple data streams and multiple errors in MISR (multiple input shift register) based parallel data compaction. Utilizing existing BIST resources with an additional MISR, it is capable of identifying any number of errors in any two input data streams, and recovering the information bits lost during signature compaction
Keywords :
VLSI; built-in self test; data compression; error detection; identification; integrated circuit testing; logic testing; shift registers; BIST resources; MISR-based data compaction; data recovery; error identification; multiple data streams; multiple errors; multiple input shift register; parallel data compaction; signature compaction; Automatic testing; Built-in self-test; Compaction; Computer errors; Fault diagnosis; Linear feedback shift registers; Polynomials; Proposals; Shift registers; Sun;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628332
