• DocumentCode
    3115750
  • Title

    Harvesting through array partitioning: a solution to achieve defect tolerance

  • Author

    Distante, F. ; Sami, M.G. ; Stefanelli, R.

  • Author_Institution
    Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
  • fYear
    1997
  • fDate
    20-22 Oct 1997
  • Firstpage
    261
  • Lastpage
    269
  • Abstract
    The problem of “harvesting” aims at obtaining the largest possible working array from an original array in which a (possibly high) number of faults are present, typically at the end of production. While complete spares efficiency has been proved to require channel width and interconnection length proportional to the dimensions of the array, techniques previously presented in literature achieved fixed-dimensions for channels and links by accepting low spares efficiency. In the present paper an approach previously adopted for survival to faults (i.e., to achieve arrays of fixed dimensions with a pre-determined distribution of spares) is extended to the harvesting problem by proving that partitioning the original array into subarrays (within a limited set of constraints) lends to effective reconfiguration. Spares efficiency is seen to be quite satisfactory
  • Keywords
    VLSI; fault tolerant computing; integrated circuit reliability; microprocessor chips; parallel architectures; reconfigurable architectures; redundancy; VLSI arrays; array partitioning; defect tolerance; harvesting problem; high fault number; processor arrays; reconfiguration; spares efficiency; subarrays; Costs; Fault tolerance; Length measurement; Multiprocessor interconnection networks; Production; Runtime; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
  • Conference_Location
    Paris
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-8168-3
  • Type

    conf

  • DOI
    10.1109/DFTVS.1997.628333
  • Filename
    628333