• DocumentCode
    3115951
  • Title

    Stroboscopic X-ray topography of quartz resonators

  • Author

    Capelle, B. ; Zarka, A. ; Zheng, Y. ; Detaint, J. ; Schwartzel, J.

  • Author_Institution
    Lab. de Miner.-Cristallographic, Univ. Pierre et Marie Curie, Paris, France
  • fYear
    1989
  • fDate
    31 May-2 Jun 1989
  • Firstpage
    470
  • Lastpage
    476
  • Abstract
    AT-cut quartz resonators containing dislocations, etch channels or growth bands have been studied by stroboscopic X-ray topography using synchrotron radiation. Experimental images and simulated ones presented here show that the acoustic wave is perturbed in the vicinity of dislocations and indicate that nonlinear terms have to be considered to describe the acoustic deformation field near dislocations. Similar experimental results were obtained in vibrating resonators containing etch channels and suggest that the influence of etch channels may be more important than that of dislocations. Classic X-ray topographs using the synchrotron radiation are also presented to show coupled modes in AT-cut quartz resonators. In particular the u2 and u3 components of the acoustic displacement were visualized simultaneously with the main thickness-shear component u 1. An interesting mechanism of the mode coupling was evidenced
  • Keywords
    X-ray diffraction examination of materials; crystal resonators; dislocations; quartz; AT-cut quartz resonators; acoustic deformation field; acoustic wave; coupled modes; dislocations; etch channels; growth bands; stroboscopic X-ray topography; synchrotron radiation; thickness-shear component; Acoustic waves; Deformable models; Etching; Nonlinear acoustics; Piezoelectricity; Proposals; Surfaces; Synchrotron radiation; Visualization; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/FREQ.1989.68905
  • Filename
    68905