DocumentCode
3115951
Title
Stroboscopic X-ray topography of quartz resonators
Author
Capelle, B. ; Zarka, A. ; Zheng, Y. ; Detaint, J. ; Schwartzel, J.
Author_Institution
Lab. de Miner.-Cristallographic, Univ. Pierre et Marie Curie, Paris, France
fYear
1989
fDate
31 May-2 Jun 1989
Firstpage
470
Lastpage
476
Abstract
AT-cut quartz resonators containing dislocations, etch channels or growth bands have been studied by stroboscopic X-ray topography using synchrotron radiation. Experimental images and simulated ones presented here show that the acoustic wave is perturbed in the vicinity of dislocations and indicate that nonlinear terms have to be considered to describe the acoustic deformation field near dislocations. Similar experimental results were obtained in vibrating resonators containing etch channels and suggest that the influence of etch channels may be more important than that of dislocations. Classic X-ray topographs using the synchrotron radiation are also presented to show coupled modes in AT-cut quartz resonators. In particular the u 2 and u 3 components of the acoustic displacement were visualized simultaneously with the main thickness-shear component u 1. An interesting mechanism of the mode coupling was evidenced
Keywords
X-ray diffraction examination of materials; crystal resonators; dislocations; quartz; AT-cut quartz resonators; acoustic deformation field; acoustic wave; coupled modes; dislocations; etch channels; growth bands; stroboscopic X-ray topography; synchrotron radiation; thickness-shear component; Acoustic waves; Deformable models; Etching; Nonlinear acoustics; Piezoelectricity; Proposals; Surfaces; Synchrotron radiation; Visualization; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/FREQ.1989.68905
Filename
68905
Link To Document