DocumentCode
3116156
Title
InP HEMT and HBT technology and applications
Author
Streit, Dwight ; Lai, Richard ; Oki, Aaron ; Gutierrez-Aitken, Augusto
Author_Institution
Space & Electron., TRW Inc., Redondo Beach, CA, USA
fYear
2002
fDate
18-19 Nov. 2002
Firstpage
14
Lastpage
17
Abstract
InP HEMT and InP HBT offer significant performance advantages for applications that range from microwave and millimeter-wave to fast digital and optoelectronic circuits. The improved transport characteristics, high transconductance, and optical integration properties of these devices hold great benefit for wireless and fiber-optic communications, radar, passive imaging and radiometer systems. We present an overview of recent results for InP devices and integrated circuits, including the current status of TRW´s, InP HEMT and HBT device and MMIC performance. The migration to new materials and process technology will enable volume production capability for high-performance applications to 200 GHz and beyond.
Keywords
III-V semiconductors; MMIC; heterojunction bipolar transistors; high electron mobility transistors; indium compounds; millimetre wave devices; millimetre wave imaging; radiometers; 200 GHz; InP; InP HBT technology; InP HEMT; MMIC; device frequency performance; device optical integration properties; fiber-optic communications; microwave/mm-wave/fast digital/optoelectronic circuits; passive imaging; power HEMT; radar; radiometer systems; transconductance; transport characteristics; wireless communications; HEMTs; Heterojunction bipolar transistors; Indium phosphide; Laser radar; Microwave circuits; Microwave devices; Millimeter wave integrated circuits; Millimeter wave radar; Millimeter wave technology; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices for Microwave and Optoelectronic Applications, 2002. EDMO 2002. The 10th IEEE International Symposium on
Print_ISBN
0-7803-7530-0
Type
conf
DOI
10.1109/EDMO.2002.1174923
Filename
1174923
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