Title :
Identification of structured automata for test evaluation
Author :
Maadani, K.El. ; Geffroy, Jean-Claude
Author_Institution :
GERII, INSAT/DGE, Toulouse, France
Abstract :
Presents an original approach to the evaluation of test sequences applied to sequential circuits represented by structured-functional models; the method is based on formal identification of the internal modules of the circuit studied. A prototype software tool has been implemented in PROLOG in order to validate the approach.<>
Keywords :
PROLOG; finite automata; logic testing; sequential circuits; software tools; PROLOG; formal identification; internal modules; sequential circuits; software tool; structured automata; structured-functional models; test evaluation; test sequences; Automata; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit interconnections; Sequential analysis; Sequential circuits; Software prototyping; Software tools;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208130
