• DocumentCode
    3116306
  • Title

    Measurements for signal integrity

  • Author

    Ricchiuti, Vittorio

  • Author_Institution
    Technolabs S.p.A., L´´Aquila
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    In this presentation, different measurement techniques for signal integrity are discussed. These are the time domain reflectometer (TDR), vector network analyzer and eye diagram techniques. Capabilities, space and time resolution and modeling of each methods are also presented.
  • Keywords
    data integrity; network analysers; reflectometers; time-domain reflectometry; eye diagram; signal integrity; time domain reflectometer; vector network analyzer; Frequency measurement; Impedance; Integrated circuit interconnections; Noise measurement; Position measurement; Reflection; Spaceborne radar; Time measurement; Velocity measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652173
  • Filename
    4652173
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3116306