DocumentCode :
3116306
Title :
Measurements for signal integrity
Author :
Ricchiuti, Vittorio
Author_Institution :
Technolabs S.p.A., L´´Aquila
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
12
Abstract :
In this presentation, different measurement techniques for signal integrity are discussed. These are the time domain reflectometer (TDR), vector network analyzer and eye diagram techniques. Capabilities, space and time resolution and modeling of each methods are also presented.
Keywords :
data integrity; network analysers; reflectometers; time-domain reflectometry; eye diagram; signal integrity; time domain reflectometer; vector network analyzer; Frequency measurement; Impedance; Integrated circuit interconnections; Noise measurement; Position measurement; Reflection; Spaceborne radar; Time measurement; Velocity measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652173
Filename :
4652173
Link To Document :
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