• DocumentCode
    3116369
  • Title

    Molecular Dynamics study of the traction-displacement relations of epoxy-copper interfaces

  • Author

    Wong, C.K.Y. ; Leung, S.Y.Y. ; Poelma, R.H. ; Jansen, K.M.B. ; Yuan, C.C.A. ; Van Drie, W.D. ; Zhang, G.Q.

  • Author_Institution
    Dept. PME, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    18-20 April 2011
  • Firstpage
    42374
  • Lastpage
    42495
  • Abstract
    The traction-displacement relations of the epoxy-copper interfaces are studied using an atomistic model. The reaction force of the epoxy layer in response to displacement of the interface is calculated during molecular dynamics simulation. A parametric study in terms of displacement rate and the step size of displacement increment has been performed. The traction-displacement relations are found sensitive to the step size of the displacement increment. The traction-displacement relations are better described with a small displacement increment in the initial region where the epoxy-copper interface is in close contact. The interfacial energy as calculated by the traction-displacement model is -0.28 Jm-2 which is comparable to the value obtained from a static model. This calculated value is also close to the thermodynamic work of adhesion (-0.26 Jm-2) of an epoxy-copper system as reported in the literature.
  • Keywords
    adhesion; copper; molecular dynamics method; polymers; surface energy; thermodynamics; traction; Cu; adhesion; atomistic model; epoxy-copper interface; interfacial energy; molecular dynamics study; thermodynamic work; traction-displacement relation; Annealing; Europe; Force; Lead;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
  • Conference_Location
    Linz
  • Print_ISBN
    978-1-4577-0107-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2011.5765785
  • Filename
    5765785