• DocumentCode
    3116407
  • Title

    Specifications for the development of an expert tool for the automatic optical understanding of electronic circuits: VLSI reverse engineering

  • Author

    Bourbakis, N.G. ; Ramamoorthy, C.V.

  • Author_Institution
    IBM, San Jose, CA, USA
  • fYear
    1991
  • fDate
    15-17 April 1991
  • Firstpage
    98
  • Lastpage
    103
  • Abstract
    Deals with the specifications for the development of an expert tool for the automatic optical detection and recognition of the connectivity among devices in digital electronic circuits and the understanding of the circuits functionality. In particular, the proposed tool, called ANTISTROFEAS, uses expert knowledge recognizing and understanding electronic circuits without the use of their associated database. The ANTISTROFEAS tool will use classical picture processing methods in combination with heuristics and knowledge acquisition schemes. The expert tool proposed is used for understanding of ´unknown´ electronic circuits, or where the complexity of the circuit is too great, so that any human searching effort requires long time for reliable results.<>
  • Keywords
    VLSI; automatic testing; computerised picture processing; expert systems; integrated circuit testing; ANTISTROFEAS; VLSI reverse engineering; automatic optical understanding; connectivity; digital electronic circuits; expert knowledge; expert tool; heuristics; knowledge acquisition schemes; picture processing methods; Artificial intelligence; Electronic circuits; Expert systems; Image processing; Optical detectors; Optical devices; Particle separators; Reverse engineering; US Department of Transportation; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
  • Conference_Location
    Atlantic City, NJ, USA
  • Type

    conf

  • DOI
    10.1109/VTEST.1991.208140
  • Filename
    208140