• DocumentCode
    3116545
  • Title

    Optimization of solder joint configuration in multi-chip packaging system

  • Author

    Hornales, Benjie Balos

  • Author_Institution
    Fairchild Semicond., Lapu-Lapu City, Philippines
  • fYear
    2011
  • fDate
    18-20 April 2011
  • Firstpage
    42373
  • Lastpage
    42464
  • Abstract
    Packaging engineers, in the search for the perfect packaging technology, are turning to three-dimensional packaging technologies that stack multiple dies/chips within a single package. Prevailing problems with stacked dies and clips are the tilting of the chips or clips due to the unbalanced bond line thickness of different solder attachments at different height levels or unbalanced weight distribution of the components inside the package. This could be a result of offset pads or inaccurate solder volume which results to uneven BLTs or solder joints, which all boils down to not having adequate modeling tools at hand to foresee potential tilting issues in a complicated solder joint system constrained in one package. This paper addresses this issue by utilizing an FEA modeling tool that can model the solder joint system of any stacked or clip packages. The tilting of the die is successfully modeled and the BLT predicted correlates well within the actual result. The mechanism of chip tilting was investigated and correlated with actual cross-section result. The availability of the modeling tool to successfully model multi-body solder joint system is a breakthrough in package tilting modeling efforts. Optimization of the solder joint system of any package is now possible with the Tool.
  • Keywords
    chip scale packaging; finite element analysis; multichip modules; solders; 3D packaging technology; FEA modeling tool; multi-body solder joint system; multi-chip packaging system; package tilting modeling; solder joint configuration; stacked dies; unbalanced bond line thickness; weight distribution; Correlation; Gravity; Joints; Nickel; Optimization; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
  • Conference_Location
    Linz
  • Print_ISBN
    978-1-4577-0107-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2011.5765796
  • Filename
    5765796