• DocumentCode
    3116696
  • Title

    New phonon in cadmium zinc telluride

  • Author

    Chack, A. ; Beserman, R. ; Stolyarova, S. ; Nemirovsky, Y. ; Weil, R.

  • Author_Institution
    Solid State Inst., Technion-Israel Inst. of Technol., Haifa, Israel
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    57
  • Lastpage
    60
  • Abstract
    The discovery of an unreported phonon in Cd1-xZnx Te is presented. This phonon is only present in thin films, and only when 0<x<1. The phonon is seen at 195 cm-1 and the Raman line is a resonant at an excitation in the vicinity if 600 nm. We believe this phonon is caused by microcrystalline clusters of ZnTe embedded in the Cd1-xZnxTe film, however, this assignation is not final, as further experiments are needed to rule out other possibilities such as a phonon from the ordered phase
  • Keywords
    II-VI semiconductors; Raman spectra; cadmium compounds; phonons; semiconductor thin films; zinc compounds; CdZnTe; Raman line; microcrystalline clusters; phonon; thin films; Cadmium compounds; Conductivity; Frequency; Infrared detectors; Phonons; Substrates; Temperature; Transistors; X-ray detectors; Zinc compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and electronic engineers in israel, 2000. the 21st ieee convention of the
  • Conference_Location
    Tel-Aviv
  • Print_ISBN
    0-7803-5842-2
  • Type

    conf

  • DOI
    10.1109/EEEI.2000.924318
  • Filename
    924318
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3116696