DocumentCode
3116713
Title
Distributed self-diagnosis of VLSI mesh array processors
Author
Cutler, Michal ; Su, Stephen Y H ; Wang, Minghsien
Author_Institution
Dept. of Comput. Sci., State Univ. of New York, Binghamton, NY, USA
fYear
1991
fDate
15-17 April 1991
Firstpage
178
Lastpage
186
Abstract
A distributed self-diagnosis algorithm for VLSI mesh arrays with small clusters of faults is presented. It allows only fault-free cells to make decisions and to propagate diagnosis results. Its time complexity is constant with respect to the number of processors. The diagnosability is proportional to the array size.<>
Keywords
VLSI; automatic testing; built-in self test; cellular arrays; computer testing; fault location; fault tolerant computing; integrated circuit testing; microprocessor chips; parallel architectures; VLSI mesh array processors; diagnosability; distributed self-diagnosis algorithm; fault-free cells; Automatic testing; Clustering algorithms; Computer science; Design automation; Distributed computing; Fault diagnosis; Signal processing; System testing; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location
Atlantic City, NJ, USA
Type
conf
DOI
10.1109/VTEST.1991.208155
Filename
208155
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