Title :
Automated diagnosis of VLSI failures
Author :
Ryan, Paul G. ; Rawa, Shishpal ; Fuchs, Kent W.
Author_Institution :
Intel Corp., Folsom, CA, USA
Abstract :
Fault dictionaries are examined as a tool for automated diagnosis of VLSI failures. A compressed fault dictionary format and diagnosis algorithms are presented. Both combinational and sequential circuits are considered. Dictionaries are created, for example ISCAS circuits and simulated errors diagnosed.<>
Keywords :
VLSI; automatic testing; combinatorial circuits; failure analysis; fault location; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; VLSI failures; automated diagnosis; compressed fault dictionary format; diagnosis algorithms; logic IC; sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Etching; Failure analysis; Fault diagnosis; Optical microscopy; Reliability engineering; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208156
