DocumentCode :
3116722
Title :
Probes for diagnosing EMC problems
Author :
Doren, Tom Van
Author_Institution :
Electromagn. Compatibility Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
6
Abstract :
A collection of slides from the author´s conference presentation is given. This paper presents the diagnostic measurement for electromagnetic compatibility.
Keywords :
electromagnetic compatibility; probes; clamp-on probes; electric field probes; electromagnetic compatibility; magnetic field probes; voltage probes; Area measurement; Coaxial cables; Current measurement; Electric variables measurement; Electromagnetic compatibility; Energy measurement; Frequency measurement; Impedance measurement; Probes; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652194
Filename :
4652194
Link To Document :
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