Design for diagnosable multiple-output digital systems

Author

Ma, He-De ; Liu, Ying

Author_Institution

Sch. of Sci. & Technol., Savannah State Coll., Univ. Syst. of Georgia, GA, USA

fYear

1991

fDate

15-17 April 1991

Firstpage

204

Lastpage

209

Abstract

A design for diagnosable multiple-output digital systems is presented, in which not only error detection is implemented by the minimum number of checkers but also fault isolation is realized by minimal additional hardware instead of traditional software diagnostic procedures such that the computation time and memory space for fault isolation are eliminated. A partition algorithm is utilized for partitioning a digital system specially into subsystems with each subsystem containing only one primary output. With the aid of this partition algorithm, an algorithm for automatic fault isolation is presented. The algorithm is suitable for computer implementation so that faults in large size digital systems can be isolated automatically. The overhead of the additional hardware to isolate faults automatically is less than 2.1%.<>

Keywords

automatic testing; digital systems; error detection; fault location; logic design; logic testing; automatic fault isolation; checkers; computer implementation; diagnosable system design; error detection; large size digital systems; multiple-output digital systems; partition algorithm; Circuit faults; Costs; Digital systems; Educational institutions; Fault detection; Hardware; Isolation technology; Partitioning algorithms; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers

Conference_Location

Atlantic City, NJ, USA

Type

conf

DOI

10.1109/VTEST.1991.208159

Filename

208159