DocumentCode
3116888
Title
Power MOSFET RDSon under repetitive avalanche cycling
Author
Bernoux, Béatrice ; Escoffier, René ; Jalbaud, Pierre ; Reynès, Jean-Michel ; Scheid, Emmanuel ; Dorkel, Jean-Marie
Author_Institution
LAAS, CNRS, Toulouse, France
fYear
2009
fDate
5-8 July 2009
Firstpage
2016
Lastpage
2019
Abstract
In this paper, a low voltage vertical power MOSFET is submitted to repetitive avalanche cycles under very high current (>400A) at high temperature (>150degC). Electrical characteristics such as BVDSS, IGSS, IDSS, VF, VGSth and RDSon are systematically tested along cycling. After a large number of avalanche pulses well above products requirements measurements show that RDSon decreases with the number of avalanche cycles whereas other parameters stay constant. With a simple model of RDSon measurement and new measurements such as the resistance of the metallization between two bonding wires we can connect this unexpected drop of RDSon measurement to MOSFET source electrode evolution.
Keywords
avalanche breakdown; electrical resistivity; low-power electronics; metallisation; power MOSFET; semiconductor device breakdown; bonding wires; electrical characteristics; low voltage MOSFET; metallization; repetitive avalanche cycling; resistance; source IEEE electrode evolution; vertical power MOSFET; Decision support systems; Electric variables; Electrical resistance measurement; Low voltage; MOSFET circuits; Metallization; Power MOSFET; Pulse measurements; System testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Conference_Location
Seoul
Print_ISBN
978-1-4244-4347-5
Electronic_ISBN
978-1-4244-4349-9
Type
conf
DOI
10.1109/ISIE.2009.5215664
Filename
5215664
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