• DocumentCode
    3116888
  • Title

    Power MOSFET RDSon under repetitive avalanche cycling

  • Author

    Bernoux, Béatrice ; Escoffier, René ; Jalbaud, Pierre ; Reynès, Jean-Michel ; Scheid, Emmanuel ; Dorkel, Jean-Marie

  • Author_Institution
    LAAS, CNRS, Toulouse, France
  • fYear
    2009
  • fDate
    5-8 July 2009
  • Firstpage
    2016
  • Lastpage
    2019
  • Abstract
    In this paper, a low voltage vertical power MOSFET is submitted to repetitive avalanche cycles under very high current (>400A) at high temperature (>150degC). Electrical characteristics such as BVDSS, IGSS, IDSS, VF, VGSth and RDSon are systematically tested along cycling. After a large number of avalanche pulses well above products requirements measurements show that RDSon decreases with the number of avalanche cycles whereas other parameters stay constant. With a simple model of RDSon measurement and new measurements such as the resistance of the metallization between two bonding wires we can connect this unexpected drop of RDSon measurement to MOSFET source electrode evolution.
  • Keywords
    avalanche breakdown; electrical resistivity; low-power electronics; metallisation; power MOSFET; semiconductor device breakdown; bonding wires; electrical characteristics; low voltage MOSFET; metallization; repetitive avalanche cycling; resistance; source IEEE electrode evolution; vertical power MOSFET; Decision support systems; Electric variables; Electrical resistance measurement; Low voltage; MOSFET circuits; Metallization; Power MOSFET; Pulse measurements; System testing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-4347-5
  • Electronic_ISBN
    978-1-4244-4349-9
  • Type

    conf

  • DOI
    10.1109/ISIE.2009.5215664
  • Filename
    5215664