Title :
Comparison between the dynamic behavior of maximum length and cyclic shift registers
Author :
Seireg, Reda H. ; Vacroux, André G.
Author_Institution :
Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
The study of the performance of maximum length and cyclic shift registers has been extended to broader classes of circuits. A new general form for the characteristic equation of the transition probability matrix was deduced which differs from equations obtained earlier.<>
Keywords :
Markov processes; matrix algebra; probability; shift registers; characteristic equation; cyclic shift registers; dynamic behavior; maximum length registers; transition probability matrix; Circuit faults; Circuit testing; Compaction; Equations; Markov processes; Performance analysis; Polynomials; Printed circuits; Shift registers; Transmission line matrix methods;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208168
