DocumentCode
3117003
Title
Short term oscillator frequency stability as a function of its phase noise distribution
Author
Elad, Danny ; Madjar, Asher
Author_Institution
RAFAEL, Haifa, Israel
fYear
2000
fDate
2000
Firstpage
129
Lastpage
133
Abstract
The rapidly emerging market for microwave communication systems such as wireless applications, forces the use of many limited bandwidth channels. The undesired linkage problem between two adjacent channels is well known. One of the causes of the linkage problem is the frequency instability of the transmitter VCO. Characterization of the short term stability enables one to calculate statistically the system “error”. This paper presents mathematical expressions to calculate the short term VCO stability, by its noise skirt. The VCO noise skirt is caused essentially by a random voltage, the phase noise. Using the expressions we present, one can estimate the linkage period time between two adjacent channels. These mathematical expressions are also used to calculate the frequency stability between two adjacent time periods of a periodic signal (e.g. FMCW)
Keywords
circuit noise; circuit stability; frequency stability; microwave oscillators; network analysis; network parameters; phase noise; voltage-controlled oscillators; FMCW; adjacent channels; adjacent time periods; central limit theorem; frequency instability; limited bandwidth channels; linkage period time estimation; linkage problem; mathematical expressions; mean parameter; microwave communication systems; noise skirt; periodic signal; phase noise distribution; power density function; random voltage; short term VCO stability; short term oscillator frequency stability; system error; transmitter VCO; variance parameter; wireless applications; Bandwidth; Couplings; Frequency; Microwave communication; Microwave oscillators; Phase noise; Stability; Transmitters; Voltage; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and electronic engineers in israel, 2000. the 21st ieee convention of the
Conference_Location
Tel-Aviv
Print_ISBN
0-7803-5842-2
Type
conf
DOI
10.1109/EEEI.2000.924342
Filename
924342
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