DocumentCode
3117040
Title
IDDq benefits (digital CMOS testing)
Author
McEuen, Steven D.
Author_Institution
Ford Microelectron. Inc., Colorado Springs, CO, USA
fYear
1991
fDate
15-17 April 1991
Firstpage
285
Lastpage
290
Abstract
The author discusses many different aspects of IDDq, quality, reliability, and test being the major three. A description of IDDq is presented with different pragmatic methods of implementing it. Employing IDDq testing on digital CMOS technology, the user obtains a product with greater reliability. These benefits are introduced, which clearly support IDDq´s implementation.<>
Keywords
CMOS integrated circuits; circuit reliability; digital integrated circuits; integrated circuit testing; leakage currents; logic testing; IDDq; digital CMOS technology; quality; reliability; testing; Assembly; CMOS technology; Circuit faults; Circuit testing; Drives; Fault diagnosis; Logic testing; Microelectronics; Springs; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location
Atlantic City, NJ, USA
Type
conf
DOI
10.1109/VTEST.1991.208172
Filename
208172
Link To Document