• DocumentCode
    3117169
  • Title

    IEC transient-immunity testing overview

  • Author

    Braxton, T.E.

  • Author_Institution
    Shure Inc., Niles, IL
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    First things first: define what constitutes a failure in your product and make that part of the test plan. Check product category to see if additional immunity tests are required. Monitor all responses as tests are executed.
  • Keywords
    IEC standards; electrostatic discharge; immunity testing; lightning; power system transients; surges; IEC transient-immunity testing; discharge methods; electrical fast transient burst; electrostatic discharge; lightning surges; magnetic field tests; shielded data line; surge test; switching surge; telecom application; Conferences; Contacts; Electromagnetic compatibility; Electrostatic discharge; IEC standards; Immunity testing; Lightning; Performance evaluation; Surges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652218
  • Filename
    4652218