• DocumentCode
    3117192
  • Title

    Efficient FDTD S-parameter calculation of microwave structures with TEM ports

  • Author

    Van Den Berghe, S. ; Olyslager, F. ; De Zutter, D.

  • Author_Institution
    Dept. of Inf. Technol., Ghent Univ., Belgium
  • Volume
    2
  • fYear
    1999
  • fDate
    11-16 July 1999
  • Firstpage
    1078
  • Abstract
    We have presented an accurate and efficient method for S-parameter calculation. The method uses a variation on the total field-scattered field formalism, the modes are injected and extracted at the interface between the total field and the error field regions. As such the propagated energy never actually reaches the boundary conditions, so these conditions can be less stringent, and should require less resources. Furthermore, the mode distributions are used to excite the structure and to calculate the amplitude of the propagating mode. This allows us to place both the excitation mechanism and the port regions very close to the simulated structure, again saving resources, as well as preserving the accuracy of the method. However, due to the dispersion of non-TEM modes, this method can only be used if the mode of interest is TEM. Our method has been compared with the method of moments approach and the results are almost identical.
  • Keywords
    S-parameters; electromagnetic wave scattering; finite difference time-domain analysis; multiport networks; strip line components; waveguide theory; S-parameter calculation; TEM ports; amplitude; boundary conditions; dispersion; efficient FDTD S-parameter calculation; excitation mechanism; microwave structures; mode distributions; modes; nonTEM modes; port regions; propagated energy; propagating mode; total field-scattered field formalism; Boundary conditions; Equations; Finite difference methods; Information technology; Microwave propagation; Microwave theory and techniques; Scattering parameters; Stripline; Strips; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1999. IEEE
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5639-x
  • Type

    conf

  • DOI
    10.1109/APS.1999.789500
  • Filename
    789500