DocumentCode
3117192
Title
Efficient FDTD S-parameter calculation of microwave structures with TEM ports
Author
Van Den Berghe, S. ; Olyslager, F. ; De Zutter, D.
Author_Institution
Dept. of Inf. Technol., Ghent Univ., Belgium
Volume
2
fYear
1999
fDate
11-16 July 1999
Firstpage
1078
Abstract
We have presented an accurate and efficient method for S-parameter calculation. The method uses a variation on the total field-scattered field formalism, the modes are injected and extracted at the interface between the total field and the error field regions. As such the propagated energy never actually reaches the boundary conditions, so these conditions can be less stringent, and should require less resources. Furthermore, the mode distributions are used to excite the structure and to calculate the amplitude of the propagating mode. This allows us to place both the excitation mechanism and the port regions very close to the simulated structure, again saving resources, as well as preserving the accuracy of the method. However, due to the dispersion of non-TEM modes, this method can only be used if the mode of interest is TEM. Our method has been compared with the method of moments approach and the results are almost identical.
Keywords
S-parameters; electromagnetic wave scattering; finite difference time-domain analysis; multiport networks; strip line components; waveguide theory; S-parameter calculation; TEM ports; amplitude; boundary conditions; dispersion; efficient FDTD S-parameter calculation; excitation mechanism; microwave structures; mode distributions; modes; nonTEM modes; port regions; propagated energy; propagating mode; total field-scattered field formalism; Boundary conditions; Equations; Finite difference methods; Information technology; Microwave propagation; Microwave theory and techniques; Scattering parameters; Stripline; Strips; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location
Orlando, FL, USA
Print_ISBN
0-7803-5639-x
Type
conf
DOI
10.1109/APS.1999.789500
Filename
789500
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