DocumentCode
3117204
Title
Magnetic probe method
Author
Shimasaki, Toshiki
Author_Institution
NEC Eng., Ltd., Tokyo
fYear
2008
fDate
18-22 Aug. 2008
Firstpage
1
Lastpage
4
Abstract
A collection of slides from the authors´ conference presentation is given.
Keywords
electric current measurement; large scale integration; LSI; SSCD effect; VDD terminal; frequency 1 GHz to 3 GHz; high frequency power current measurement; magnetic probe method; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location
Detroit, MI
Print_ISBN
978-1-4244-1699-8
Electronic_ISBN
978-1-4244-1698-1
Type
conf
DOI
10.1109/ISEMC.2008.4652219
Filename
4652219
Link To Document