Title :
Half power beamwidth and high power measurements: The dangers of using far field approximations in the near field
Author :
Rodriguez, Vicente
Author_Institution :
ETS-Lindgren, Cedar Park, TX
Abstract :
A collection of slides from the author´s conference presentation is given. This paper discusses the dangers of using far field approximations in the near field during antenna testing.
Keywords :
antenna radiation patterns; antenna testing; antenna radiation patterns; antenna testing; far field approximations; half power beamwidth; high power measurements; near field testing; Antenna radiation patterns; Design engineering; Directive antennas; Electromagnetic compatibility; Energy management; Engineering management; Near-field radiation pattern; Power engineering and energy; Power measurement; Product design;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652224
