DocumentCode
3117414
Title
FIT numerical modeling for EMI Discovery and #x201C;Design#x201D;
Author
Drewniak, J.
Author_Institution
UMR/MS&T EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
fYear
2008
fDate
18-22 Aug. 2008
Firstpage
1
Lastpage
11
Abstract
A collection of slides from the authors´ conference presentation is given.
Keywords
SPICE; electromagnetic interference; EMI; FIT; SPICE; numerical modeling; Electromagnetic compatibility; Electromagnetic interference; Laboratories; Numerical models; Physics; Predictive models; SPICE; Solid modeling; Stripline; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location
Detroit, MI
Print_ISBN
978-1-4244-1699-8
Electronic_ISBN
978-1-4244-1698-1
Type
conf
DOI
10.1109/ISEMC.2008.4652229
Filename
4652229
Link To Document