Simulation of aging effects on radiated emission of microstrip line

Author

Fridhi, Hassene ; Duchamp, Geneviève ; Vignéras, Valérie

Author_Institution

IMS, Univ. Bordeaux 1, Talence, France

fYear

2011

fDate

18-20 April 2011

Firstpage

42375

Lastpage

42527

Abstract

This paper deals with the influence of humidity and temperature stresses on a microstrip line. These aging factors induce degradation on the dielectric and geometric properties. So the aim of this study is the evaluation of the influence of such variations on the radiated emission of a microstrip line using electromagnetic simulator. Due to the difficulty to interpret and analyze the results because of the correlation between the parameters, we have established a Design Of Experiments (DOE) to optimize the simulation procedure. The result coupled to ANOVA method gives better knowledge on the influence´s factors. The study´s conclusions lead to simplify the experiment´s tests.

Keywords

ageing; design of experiments; microstrip lines; statistical analysis; ANOVA method; aging effect simulation; design of experiments; dielectric property; electromagnetic simulator; geometric property; humidity; microstrip line radiated emission; temperature stresses; Aging; Dielectrics; Electromagnetics; Lead; Magnetic resonance imaging; Mechanical factors; Permittivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on

Conference_Location

Linz

Print_ISBN

978-1-4577-0107-8

Type

conf

DOI

10.1109/ESIME.2011.5765837

Filename

5765837