Suzuki, M. ; Notomi, S. ; Ono, M. ; Kobayashi, N. ; Milan, E. ; Odani, K. ; Mimura, T. ; Abe, M.
Author_Institution :
Fujitsu Laboratories Ltd.
fYear :
1991
fDate :
13-15 Feb. 1991
Firstpage :
48
Lastpage :
287
Keywords :
Driver circuits; Electrodes; Gallium arsenide; HEMTs; Power dissipation; Random access memory; Read-write memory; Solid state circuits; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
