• DocumentCode
    3117687
  • Title

    Jitter: Basics, relevance and measurement methods

  • Author

    Pommerenke, David

  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    14
  • Abstract
    A collection of slides from the authors´ conference presentation is given.
  • Keywords
    circuit noise; jitter; time-varying networks; bit error rate; eye diagram; jitter; measurement methods; time domain; Bit error rate; Clocks; Distortion measurement; Frequency measurement; Jitter; Phase noise; Sampling methods; Signal analysis; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652242
  • Filename
    4652242
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3117687