• DocumentCode
    3117735
  • Title

    The Determination of Electrical Parameters of Partially Plated Quartz Crystal Plates with the Consideration of Dissipation

  • Author

    Wang, Ji ; Zhao, Wenhua ; Du, Jianke

  • Author_Institution
    Piezoelectric Device Lab., Ningbo Univ.
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    32
  • Lastpage
    35
  • Abstract
    Recently, as the theory for bulk acoustic wave resonator analysis and design moves toward considering the dissipation of quartz crystal through the inclusion of viscosity, we finally have the opportunity to derive electrical parameters through vibration solutions of a crystal plate representing an ideal resonator. In this study, we use the first-order Mindlin plate equations of a piezoelectric plate for the thickness-shear vibration analysis of a simple resonator model which is a partially plated quartz crystal plate with free sides, and expressions of electrical parameters are derived with particular emphasis on the resistance that is related to the imaginary part of complex elastic constants, or the viscosity. All these electrical parameters are frequency dependent, providing the chance to study the frequency behavior of crystal resonators with a direct formulation. We calculated the electrical parameters from our simple resonator of partially plated AT-cut quartz crystal with the first-order Mindlin plate theory
  • Keywords
    crystal resonators; elastic constants; quartz; viscosity; AT-cut quartz crystal; Mindlin plate equations; SiO2; complex elastic constants; crystal resonators; electrical parameter determination; ideal resonator; partially plated quartz crystal; piezoelectric plate; thickness-shear vibration analysis; viscosity; Acoustic waves; Acoustical engineering; Crystalline materials; Design engineering; Electric resistance; Equations; Frequency; Image analysis; Piezoelectric devices; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Frequency Control Symposium and Exposition, 2006 IEEE
  • Conference_Location
    Miami, FL
  • Print_ISBN
    1-4244-0074-0
  • Electronic_ISBN
    1-4244-0074-0
  • Type

    conf

  • DOI
    10.1109/FREQ.2006.275347
  • Filename
    4053725