DocumentCode
3117889
Title
High digitalized resolution and low switching loss for high power electronics converters based on multi-sampling technology
Author
Kong, Jie ; Lian, Jianyang ; Qiu, Zhiling ; Chen, Guozhu
Author_Institution
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
fYear
2009
fDate
5-8 July 2009
Firstpage
2032
Lastpage
2036
Abstract
Digital control has been widely used in power electronics and its sampling rate is important to the control precision. Generally, faster the sampling rate is, closer the digital control is to that of its analog/original antetype. However, in most power electronics system, the sampling rate is commonly once or twice of the PWM switching frequency, which is vital for switching losses. This coupled relationship may result in conflict between high digitalized resolution and high efficiency, especially for high power applications. Multi-sampling technology is to sample the signal many times in one PWM period. Therefore, it doesn´t need to increase the switching speed proportionally while fastening the sampling rate. This paper adopts the multi-sampling in an active power filter (APF) application. A logic method to deal with the problem during implementation due to the nature of digital controller is first proposed. Principle and implementation of this technology is discussed in detail. Analysis and experiment results show that the high compensation performance and low switching loss can be both achieved using the multisampling method.
Keywords
PWM power convertors; active filters; digital control; power filters; sampling methods; switching convertors; PWM switching frequency; active power filter; digital control; high power electronics converter; low switching losses; multisampling technology; Active filters; Digital control; Joining processes; Power electronics; Pulse width modulation; Sampling methods; Signal resolution; Switching converters; Switching frequency; Switching loss;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Conference_Location
Seoul
Print_ISBN
978-1-4244-4347-5
Electronic_ISBN
978-1-4244-4349-9
Type
conf
DOI
10.1109/ISIE.2009.5215916
Filename
5215916
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