• DocumentCode
    3117910
  • Title

    Embedded high-precision frequency-based capacitor measurement system

  • Author

    Welter, Loic ; Dreux, Philippe ; Portal, J.-M. ; Aziza, H.

  • Author_Institution
    STMicroelectron. Rousset, Rousset, France
  • fYear
    2013
  • fDate
    8-10 July 2013
  • Firstpage
    116
  • Lastpage
    121
  • Abstract
    This paper presents a direct way to measure the electrical value of capacitors embedded in a circuit using a ring-oscillator. A calibration system ensures robustness towards temperature, power supply and process variations. The measurement is largely automated to minimize the use of external instrumentation and to speed-up the measurement process while giving a digital signature of the capacitor value. Design-Of-Experiment (DOE) methodology has been conducted in order to validate the ability of the system to measure robustly a large range of small capacitors.
  • Keywords
    calibration; capacitance measurement; capacitors; computerised instrumentation; design of experiments; embedded systems; measurement systems; oscillators; DOE methodology; automated measurement; calibration system; capacitor value; design of experiment methodology; digital signature; electrical value measurement; embedded high-precision frequency-based capacitor measurement system; measurement process variations; power supply variation; ring-oscillator; Decision support systems; Testing; embedded capacitor measurement; process variations; ring oscillator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
  • Conference_Location
    Chania
  • Type

    conf

  • DOI
    10.1109/IOLTS.2013.6604061
  • Filename
    6604061